ISSN 2196-5625 CN 32-1884/TK
1 Indian Institute of Technology, Kanpur, Kanpur, India 2 PJM Interconnection, Audubon, PA, USA 3 Department of Electrical Engineering, University of Nebraska–Lincoln, Lincoln, NE, USA
This work is supported by the Department of Science and Technology (DST), New Delhi, India (No. DST/EE/ 2014127). Also, D.D. Sharma acknowledges the MJP Rohilkhand University, Bareilly, UP for providing leave for pursuing PhD at IIT Kanpur. The views presented in this paper do not necessarily represent those of the PJM Interconnection, USA.